Software for High Resolution Electron Microscopy

 

 
  

MacTempasX

MacTempasX Version 2 represent a major upgrade of MacTempas. The program has been expanded to include a huge number of new features. In addition to the basic image/diffraction HRTEM capabilities, STEM and CBED calculations have been included. The program now includes both basic and advanced image processing capabilities as well as quantitative image comparison and structure refinement.

Universal Application

Short Highlight of MacTempasX Features

  • Full multislice calculation of High Resolution TEM Images and Dynamical Diffraction Patterns
  • Full multislice calculation of High Resolution STEM images
  • "Live" control of calculated HRTEM image and exit wave as a function of simulation parameters
  • Calculation of kinematical SAD patterns and Kikuchi patterns
  • Calculation of kinematical CBED patterns
  • Bloch wave calculation of CBED patterns
  • Ring patterns
  • Automatic calculation of HRTEM tilt series
  • Full quantitative comparison of simulated and experimental images
  • Structure and microscope parameter refinement based on quantitative image match
  • Reciprocal space tables, plane spacing and angle calculator
  • Full image manipulation
  • All basic image processing features
  • Advanced image processing features, real space, reciprocal space filters, masks, noise filters, etc.
  • Peak finding, peak fitting and lattice fitting
  • Template matching for pattern search
  • Real and reciprocal space displacement and strain analysis
  • Crystallographic image processing
  • diffraction pattern quantification
  • Motif extraction and averaging with noise estimation
  • Full reverse polish notation image calculator
  • Image alignment
  • Focus determination
  • Supports reading Gatan Digital Micrograph images (image data and calibration)
  • Optional Digital Micrograph compatible scripting language
  • Optional exit wave and object reconstruction package
  • Plus many more features...
Example screen shots from MacTempasX

Main Display Window showing some examples of calculated data from a given atomistic model

Starting point for computing a CBED Pattern

Starting point for computing a Tomographic Tilt Series

 

A Simulated Image with a "Live Microscope Control"

The Image is updated "Live" as new input parameters are given

The Control Window serving as a starting point for extracting quantitative data from experimental diffraction patterns

Peak information extracted from the diffraction spots at the determined lattice

 

Crystallographic Image Processing using symmetrized data from the 2D-Periodic Unit Cell

 

Fourier Image Processing using a periodic lattice mask

 

Geometric Phase Analysis using data from information around diffracted spots to determine lattice deviations and strain

Geometric Phase Analysis showing a gray level depiction of the deviations from a reference lattice in the x-direction together with a vector map showing the 2D deviations from the same lattice.

The built in Reverse Polish Notation Calculator which operates on real and complex images as well as real and complex numbers

Starting point for quantitative matching between experimental data with simulation using a number of criteria for the quantitative fit. The quantitative fit can also be used to refine a structure by minimizing the discrepancy between calculation and experiment